LWsphere®Si-Spacer has very narrow particle size distribution, enable precise control of cell thickness, no damage to substrates, and higher clarity.
Very uniform particle size with a coefficient of variation CV of less than 2.5%
Good monodispersity, no overlap or agglomeration
High purity, no pollution
High mechanical strength, K>4500
Excellent heat, cold and chemical resistance
|Average particle size, µm||± 0.05||Coulter Particle Size Analysis Counter|
|Particle size distribution CV value||1.0% -2.5%||Coulter Particle Size Analysis Counter|
|10% Modulus of Elasticity, kgf/mm2||> 4500||Shimadzu MCT210|
|Specific gravity, g/cm3||2.1||Multi-Volume Density test|
|Thermal Decomposition Temp,℃in air||not decomposed|
|Refractive Index||1.46||20 ºC, λ=589 nm|
LWsphere®Si-Spacer is of very uniform particle size
The particle size and distribution of LWsphere®Si-Spacer were determined using internationally recognized testing instruments (Beckman Coulter Counter Multisizer) and methods. To ensure accurate results, each measurement is calibrated with NIST-traceable standard particles before each measurement.The coefficient of variation, CoefficientValue(CV)%(standarddeviation/averagediameter)x100, is controlled below 2.5%.